The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 19, 2011
Filed:
Mar. 28, 2008
Applicant:
Kazutoshi Takagi, Tokyo, JP;
Inventor:
Kazutoshi Takagi, Tokyo, JP;
Assignee:
Kabushiki Kaisha Topcon, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
An operation microscope includes a microscope body having an illumination optical system which illuminates a subject, a lens barrel, and a main observation optical system which observes the subject, an assistant's microscope unit attached to the microscope body, and a guide rail which is disposed in the lens barrel of the microscope body, and extends in a circumferential direction about a center of an optical axis of an objective lens of the microscope body. The assistant's microscope unit is disposed in the guide rail to be movable between a usage position and a non-usage position in a circumferential direction of the lens barrel.