The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 19, 2011
Filed:
Sep. 21, 2006
Katsushige Nakamura, Tokyo, JP;
Minoru Nakamura, Tokyo, JP;
Katsuhiro Miura, Tokyo, JP;
Masao Doi, Tokyo, JP;
Katsushige Nakamura, Tokyo, JP;
Minoru Nakamura, Tokyo, JP;
Katsuhiro Miura, Tokyo, JP;
Masao Doi, Tokyo, JP;
Mitaka Kohki Co., Ltd., Tokyo, JP;
Abstract
An optical measuring system has a first optical measuring instrument and a second optical measuring instrument. The optical measuring system includes a first optical path to guide a first beam from a measuring region to the first optical measuring instrument, a second optical path to guide a second beam from the measuring region to the second optical measuring instrument, an optical system through which the first and second optical paths extend and in which the first and second optical paths are paraxial, a reflection area to change the direction of the first optical path, the second optical path crossing the reflection area, and a light transmission area arranged at a position where the reflection area and second optical path cross each other, the light transmission area having a higher light transmittance than the reflection area.