The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7982861 B1

PDF
Full Text
Expired
Date of Patent:
Jul. 19, 2011

Filed:

Jul. 31, 2008
Applicants:

James B. Abshire, Clarksville, MD (US);

Xiaoli Sun, Clarksville, MD (US);

Inventors:

James B. Abshire, Clarksville, MD (US);

Xiaoli Sun, Clarksville, MD (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01C 3/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for measuring time delay and distance may include providing an electromagnetic radiation carrier frequency and modulating one or more of amplitude, phase, frequency, polarization, and pointing angle of the carrier frequency with a return to zero (RZ) pseudo random noise (PN) code. The RZ PN code may have a constant bit period and a pulse duration that is less than the bit period. A receiver may detect the electromagnetic radiation and calculate the scattering profile versus time (or range) by computing a cross correlation function between the recorded received signal and a three-state RZ PN code kernel in the receiver. The method also may be used for pulse delay time (i.e., PPM) communications.


Find Patent Forward Citations

Abshire, James. (2011). Time delay and distance measurement (U.S. Patent No. 7982861). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7982861

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