The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 19, 2011
Filed:
Mar. 29, 2005
Peter R Coward, Malvern, GB;
Neil a Salmon, Malvern, GB;
Peter R Coward, Malvern, GB;
Neil A Salmon, Malvern, GB;
QinetiQ Limited, London, GB;
Abstract
A millimeter wave imaging apparatus and method capable of identifying the presence of relatively thin dielectric materials is disclosed. The method involves taking a plurality of millimeter wave images of a scene at different frequencies and analyzing the images at different frequencies to look for frequency dependent effects in the scene. Relatively thin dielectric materials can lead to interference effects which can be detected. In one embodiment the imaging apparatus comprises a millimeter wave imager () connected to a processor () and at least one variable frequency illumination source (). The or each illumination source sweeps the illumination frequency across a reasonably wide bandwidth and the imager captures radiation returned from the scene at a number of different illuminating frequencies.