The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 19, 2011
Filed:
Sep. 04, 2007
Walter Curt, Harrisonburg, VA (US);
Glen K. Shomo, Harrisonburg, VA (US);
Christopher Mullins, Penn Laird, VA (US);
Walter Curt, Harrisonburg, VA (US);
Glen K. Shomo, Harrisonburg, VA (US);
Christopher Mullins, Penn Laird, VA (US);
Power Monitors, Inc., Mount Crawford, VA (US);
Abstract
A system for testing PLC equipment, network conditions, and protocol performance is provided. Noise measurements can be made at a single point, and protocol traffic, signal levels, and upper-layer parameters of any transmissions by other equipment on the same network are logged. Alternatively, a plurality of units located at different points in the PLC network are at least part of a distributed test system. As a result, coordinated tests can be conducted by multiple nodes, such as point-to-point network transfer function measurement and analysis, estimation of the location of noise sources and system null and resonances, receiver operating curve (ROC) measurements with actual protocol modulation, or any other suitable tests. Preferably, the test devices are able to test using a plurality of PLC protocols. In some devices, PLC protocol-specific modules can be added or removed as desired to increase, decrease or change the test device's protocol abilities.