The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 19, 2011
Filed:
Apr. 04, 2007
Wanheng Wang, Pleasanton, CA (US);
Yi-shung Chaug, Cupertino, CA (US);
Yajuan Chen, Fremont, CA (US);
Gary Yih-ming Kang, Fremont, CA (US);
Jimmy Yen, San Jose, CA (US);
Wanheng Wang, Pleasanton, CA (US);
Yi-Shung Chaug, Cupertino, CA (US);
Yajuan Chen, Fremont, CA (US);
Gary Yih-Ming Kang, Fremont, CA (US);
Jimmy Yen, San Jose, CA (US);
SiPix Imaging, Inc., Fremont, CA (US);
Abstract
The present invention relates to methods for inspection of defects in an electrophoretic display and related devices. The method may be carried out with one or more testing electrodes. The method comprises applying a voltage difference to two testing electrodes which are in contact with the display panel, or applying a voltage difference to a testing electrode and a electrode layer. The methods may be applied in in-line or off-line inspection of a display panel.