The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 19, 2011

Filed:

Sep. 18, 2009
Applicants:

Toshiyuki Hattori, Hachioji, JP;

Yusuke Yamashita, Hino, JP;

Yasunari Matsukawa, Saitama, JP;

Masaharu Tomioka, Hino, JP;

Inventors:

Toshiyuki Hattori, Hachioji, JP;

Yusuke Yamashita, Hino, JP;

Yasunari Matsukawa, Saitama, JP;

Masaharu Tomioka, Hino, JP;

Assignee:

Olympus Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
Abstract

A microscope system comprises a microscope including a motorized stage on which is mounted a container containing a specimen and which can adjust the position of the container, a scanner scanning laser light radiated onto the specimen, an objective lens focusing the scanned laser light, an image-acquisition unit acquiring a specimen image by detecting fluorescence produced in the specimen, and a dark box containing these components; a storage unit storing the mounting position of the container on the motorized stage; an image-acquisition-position setting unit setting acquisition positions of partial images of the inside of the container, on the basis of the stored mounting position of the container; a control section controlling the microscope so as to acquire the partial images for each container on the basis of the set acquisition positions; and a map-image generating section arranging the partial images to generate a map image.


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