The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7982155 B1

PDF
Full Text
Expired
Date of Patent:
Jul. 19, 2011

Filed:

Oct. 23, 2009
Applicant:

Masafumi Asano, Yokohama, JP;

Inventor:

Masafumi Asano, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B07C 5/344 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system of testing semiconductor devices includes a classification module configured to classify a plurality of lots into a plurality of groups; an apparatus assignment module configured to assign a plurality of testing apparatuses to each of the groups; and a test recipe creation module configured to create a test recipe to test defects in a second group other than a first group specified in the groups, the test recipe including a definition of testing positions in the second group defined by a rule different from the first group.


Find Patent Forward Citations

Asano, Masafumi. (2011). System of testing semiconductor devices, a method for testing semiconductor devices, and a method for manufacturing semiconductor devices (U.S. Patent No. 7982155). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7982155

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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