The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 19, 2011
Filed:
May. 29, 2008
Applicants:
Jeffery S. Reynolds, New Fairfield, CT (US);
Mu Wu, Hopewell Junction, NY (US);
Matthew Holzer, San Francisco, CA (US);
Hoi-cheong Steve Sun, Mount Kisco, NY (US);
Inventors:
Jeffery S. Reynolds, New Fairfield, CT (US);
Mu Wu, Hopewell Junction, NY (US);
Matthew Holzer, San Francisco, CA (US);
Hoi-Cheong Steve Sun, Mount Kisco, NY (US);
Assignee:
Bayer Healthcare LLC, Tarrytown, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 35/00 (2006.01); G01N 27/22 (2006.01);
U.S. Cl.
CPC ...
Abstract
A device includes a sensor array and a processor is automatically calibrated. The sensor array collects data from a pattern using at least one of a capacitive measurement and a radio frequency measurement. The pattern is included on a calibration storage device. The processor receives the data from the sensor array and calibrates the device in accordance with the data.