The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 19, 2011
Filed:
Dec. 11, 2008
James J. Haflinger, San Diego, CA (US);
Arthur K. Wilson, San Diego, CA (US);
Gary A. Kneezel, Webster, NY (US);
James J. Haflinger, San Diego, CA (US);
Arthur K. Wilson, San Diego, CA (US);
Gary A. Kneezel, Webster, NY (US);
Eastman Kodak Company, Rochester, NY (US);
Abstract
A method for measuring dimensions of a stack of medium in a media input location of an imaging system, includes emitting light along a direction that is at a predetermined angle with respect to the normal of the planar surface of the media input location. An array of photosensors are disposed along an array direction that lies in a plane defined by the direction of the light and the normal of the planar surface. The photosensors receive a spatially-varying pattern of light reflected from a surface that is substantially parallel to the planar surface of the media input location to provide corresponding electronic signal data from the photosensor array for subsequent transmission to a printing system controller. The varying electronic signal data is used to provide a measurement of the one or more dimensions corresponding to the stack of medium.