The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7979761 B1

PDF
Full Text
Expired
Date of Patent:
Jul. 12, 2011

Filed:

Dec. 10, 2008
Applicants:

Bum-keun Kim, Yongin-si, KR;

Kyung-young Kim, Suwon-si, KR;

Jung-hwan OH, Suwon-si, KR;

Beom-seok Lee, Hwaseong-si, KR;

Inventors:

Bum-keun Kim, Yongin-si, KR;

Kyung-young Kim, Suwon-si, KR;

Jung-hwan Oh, Suwon-si, KR;

Beom-seok Lee, Hwaseong-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A memory test device, including a universal register to conduct an operation by a predetermined universal command language; an extension register having a larger capacity than the universal register and to conduct an operation by a predetermined extension command language; and a controller to write a predetermined test pattern in an external memory using the extension command language, to read the test pattern written in the memory, to determine the identity of the written test pattern and the read test pattern, and to determine a presence of an error in the memory using the universal command language.


Find Patent Forward Citations

Kim, Bum-keun. (2011). Memory test device and memory test method (U.S. Patent No. 7979761). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7979761

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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