The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 12, 2011

Filed:

Aug. 16, 2006
Applicant:

Hee Wong, San Jose, CA (US);

Inventor:

Hee Wong, San Jose, CA (US);

Assignee:

National Semiconductor Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

A multiplexed digital proportional-integral-derivative filter receives error signal samples and operates in different states during sub-cycles of a single system cycle. A single multiplier and a single adder within the filter calculate at least portions of a proportional control signal, an integral control signal and a derivative control signal for one error signal sample during successive sub-cycles. The calculated control signal portions are aggregated to produce a filtered error signal for the respective error signal sample. The original resolution at lower cost, or increased resolution at the original cost, are achieved, as well as full programmability of loop gain with only negligible increase in loop latency.


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