The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 12, 2011

Filed:

Apr. 04, 2008
Applicants:

Feng Cheng, Chappaqua, NY (US);

David Gamarnik, New York, NY (US);

Wanli Min, Cortlandt Manor, NY (US);

Bala Ramachandran, Harrison, NY (US);

Jonathan Miles Collin Rosenoer, Marin County, CA (US);

Inventors:

Feng Cheng, Chappaqua, NY (US);

David Gamarnik, New York, NY (US);

Wanli Min, Cortlandt Manor, NY (US);

Bala Ramachandran, Harrison, NY (US);

Jonathan Miles Collin Rosenoer, Marin County, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06Q 10/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Risk in business management is analyzed based on a probabilistic network approach which quantifies the impact of operational risk on financial metrics such as Value-at-Risk (VAR) and/or Potential Losses (PL). This approach provides further capability to determine the optimal placement of one or more countermeasures within a system to minimize the impact of operational risks.


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