The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 2011
Filed:
May. 07, 2008
Applicants:
Alissa M. Fitzgerald, Menlo Park, CA (US);
David M. Pierce, Afton, MN (US);
Inventors:
Alissa M. Fitzgerald, Menlo Park, CA (US);
David M. Pierce, Afton, MN (US);
Assignee:
A. M. Fitzgerald & Associates, LLC, Burlingame, CA (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/18 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for predicting failures in crystalline microstructures is described. Fracture stress distribution data obtained from test samples prepared according to the same manufacturing process as a contemplated device is used to characterize the strength of surfaces in a numerical stress analysis of the device. The reliability is then calculated for surface nodes on the device. The product of all such reliabilities yields the overall reliability (or 1—the overall failure probability) of the device.