The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 2011
Filed:
Dec. 13, 2006
Marc Buttmann, Duesseldorf, DE;
Philipp Roth, Leonberg, DE;
Ralf Hüsges, Leverkusen, DE;
Abstract
In a method for calibrating a measuring device, a signal of a first sensor is mapped to a measured value based on a mapping specification. A current measured value of the measuring device is recorded as current calibration measured value; a laboratory reference sample of the measured medium with properties of the calibrated measured value at the point in time of the recording is supplied to a laboratory reference measuring device; the actual value of the measured variable is ascertained based on the laboratory reference sample and made available and recorded as current laboratory reference measured value; and, based on the current calibration measured value, as well as the current laboratory reference measured value, the mapping specification is updated. At least one earlier value pair of a calibration measured value and an associated laboratory reference measured value ascertained in an earlier calibration is considered in updating the mapping specification.