The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 2011
Filed:
Jun. 17, 2008
Applicants:
Stephen A. Muller, Santa Clara, CA (US);
Xiao-ding Cai, Fremont, CA (US);
Agustin Del Alamo, San Diego, CA (US);
James M. Frei, Sunol, CA (US);
Inventors:
Stephen A. Muller, Santa Clara, CA (US);
Xiao-Ding Cai, Fremont, CA (US);
Agustin Del Alamo, San Diego, CA (US);
James M. Frei, Sunol, CA (US);
Assignee:
Oracle America, Inc., Redwood City, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 37/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
Method and system that test device sensitivity according to whether the device passes or fails when subjected to a test signal. The device may be repeatedly subjected to test signal at varying operating parameters in order to assess pass-fail threshold at which the device transitions from operating properly/improperly to operating improperly/properly.