The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 2011
Filed:
Jun. 22, 2009
Kuang-yu Yen, Hsinchu, TW;
Meng-han Hsieh, Hsinchu, TW;
Hou-wei Lin, Hsinchu, TW;
Chi-shun Weng, Hsinchu, TW;
Kuang-Yu Yen, Hsinchu, TW;
Meng-Han Hsieh, Hsinchu, TW;
Hou-Wei Lin, Hsinchu, TW;
Chi-Shun Weng, Hsinchu, TW;
Realtek Semiconductor Corp., Hsinchu, TW;
Abstract
The invention provides a method for testing a transmission medium used in a full-duplex communication system comprising an endpoint that comprises a transmitting end (TX) and a receiving end (RX); the method comprises the steps of: first, transmitting a transmitted signal which comprises a test signal sequence with a high auto-correlation characteristic; then, receiving a received signal, and performing a correlation operation on the test signal and the received signal; finally, according to the result of the correlation operation, determining the impedance matching condition of the transmission medium.