The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 2011
Filed:
Oct. 25, 2006
Xueli Wang, Beijing, CN;
Akihiko Nishide, Tokyo, JP;
Akira Hagiwara, Tokyo, JP;
Kotoko Morikawa, Tokyo, JP;
Xueli Wang, Beijing, CN;
Akihiko Nishide, Tokyo, JP;
Akira Hagiwara, Tokyo, JP;
Kotoko Morikawa, Tokyo, JP;
GE Medical Systems Global Technology Company, LLC, Waukesha, WI (US);
Abstract
The present invention is intended to improve the quality of a three-dimensional display image, an MPR display image, or an MIP display image presented by an X-ray CT system that performs a conventional (axial) scan, a cine scan, or a helical scan. The X-ray CT system includes an image reconstruction unit or an image display unit. The image reconstruction unit or image display unit measures deviations of tomographic images in an x direction that is a horizontal direction and deviations thereof in a y direction that is a vertical direction according to the continuity in a z direction of an object that exhibits high CT numbers and that is visualized as a reference in the tomographic images; such as, a cradle, a head holder, the surface of a subject's body, or a bone. The image reconstruction unit or image display unit then compensates the deviations.