The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 2011
Filed:
Mar. 20, 2008
Applicants:
Karsten Brueninghaus, Salzgitter, DE;
Oliver Klein, Nuremberg, DE;
Jaroslaw Niewczas, Nümberg, DE;
Inventors:
Assignee:
Telefonaktiebolaget LM Ericsson (publ), Stockholm, SE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 1/06 (2006.01); H03K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
The present invention provides a method and apparatus for adapting a current path delay estimate for path delay tracking. In order to determine the path delay an operating mode is selected and a set of hypothesized path delays are determined based on said operating mode. A metric for each hypothesized path delay is determined, and a current path delay estimate is adapted based on the computed metrics for the hypothesized path delays.
Brueninghaus, Karsten. (2011). Interpolating grake with two step delay hypothesis testing (U.S. Patent No. 7978751). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7978751
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile