The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 2011
Filed:
Nov. 21, 2007
Peter Reimer, Ellwangen, DE;
Christoph Hauger, Aalen, DE;
Alfons Abele, Schwäbisch Gmünd, DE;
Markus Seesselberg, Aalen, DE;
Peter Reimer, Ellwangen, DE;
Christoph Hauger, Aalen, DE;
Alfons Abele, Schwäbisch Gmünd, DE;
Markus Seesselberg, Aalen, DE;
Carl Zeiss Surgical GmbH, Oberkochen, DE;
Abstract
A surgical microscope () has a viewing beam path for main viewing and a secondary beam path () for viewing by another person. The surgical microscope () has a microscope main objective () through which the viewing beam path for main viewing and the viewing beam path () for secondary viewing pass. The surgical microscope () includes an OCT-system () for examining an object region. The OCT-system () includes an OCT-scanning beam () which is guided through the microscope main objective (). In the viewing beam path () for secondary viewing, an in-coupling element () is provided to couple the OCT-scanning beam () into the viewing beam path () for secondary viewing and to guide the same through the microscope main objective () to the object region ().