The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 2011
Filed:
Feb. 16, 2010
Nabeel A. Riza, Oviedo, FL (US);
Nabeel A. Riza, Oviedo, FL (US);
University of Central Florida Research Foundation, Inc., Orlando, FL (US);
Abstract
Methods and systems for realizing high resolution three-dimensional (3-D) optical imaging using diffraction limited low resolution optical signals. Using axial shift-based signal processing via computer based computation algorithm, three sets of high resolution optical data are determined along the axial (or light beam propagation) direction using low resolution axial data. The three sets of low resolution data are generated by illuminating the 3-D object under observation along its three independent and orthogonal look directions (i.e., x, y, and z) or by physically rotating the object by 90 degrees and also flipping the object by 90 degrees. The three sets of high resolution axial data is combined using a unique mathematical function to interpolate a 3-D image of the test object that is of much higher resolution than the diffraction limited direct measurement 3-D resolution. Confocal microscopy or optical coherence tomography (OCT) are example methods to obtain the axial scan data sets.