The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 2011
Filed:
Dec. 22, 2004
Bruno Francois Pouet, Los Angeles, CA (US);
Bruno Francois Pouet, Los Angeles, CA (US);
Bossa Nova Technologies, LLC, Venice, CA (US);
Abstract
A multi-channel laser interferometric method and apparatus are provided for optically measuring transient motion from a surface (). A laser beam () is generated and then divided into first and second beams having respective intensities representing minor and major fraction of the predetermined laser intensity. The reference beam () illuminates the surface () at which deformation is expected. The light back-scattered by the surface is collected by a single aperture lens () and then made to interfere with the probe beam () which has been expanded (), onto a two-dimensional array of detectors (). Each signal () corresponding to each detector of the array is converted individually to an electrical signal, each electrical signal is amplified and processed (), and the plurality of processed signals () is then averaged in an electrical summing means ().