The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 2011
Filed:
Apr. 10, 2007
Sipke Wadman, Eindhoven, NL;
Sipke Wadman, Eindhoven, NL;
Koninklijke Philips Electronics N.V., Eindhoven, NL;
Abstract
An optical measurement device for measuring the optical appearance of a surface () of a sample (), in particular a surface () of a human skin, wherein the surface is at least partly translucent, comprising: an illumination device () for illuminating the surface () with an illumination beam (), wherein the illumination beam () is generated from a radiation beam emitted from a radiation source (), a detection device () for intercepting a response beam (), wherein the response beam () is generated as a response of the sample () to the illumination beam (), incident on the surface (). The optical measuring device comprises a measuring head (), that can be brought into contact with the surface () of the sample (), wherein the measuring head () comprises at least one elongated aperture () that is designed such that the response beam (), generated below the surface () in a sub-surface area () of the sample (), is detected by the detection device (), wherein the illumination beam () directly reflected at the surface is cut off.