The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 2011
Filed:
Dec. 27, 2007
Jian-gen Pan, Hangzhou, CN;
Qian LI, Hangzhou, CN;
Jian-gen Pan, Hangzhou, CN;
Qian Li, Hangzhou, CN;
Everfine Photo-E-Info Co., Ltd., Hangzhou, CN;
Abstract
A multi-channel array spectrometer combines a spectral measurement system and a reference detector which measures photometric or radiometric qualities. High accuracy photometric or radiometric measurement of a wide dynamic range can be achieved by correcting measurement results of the reference detector with a spectral correction factor. The multi-channel array spectrometer comprises a bandpass filter wheel holding a set of bandpass filters and an open hole. The wheel is placed between an entrance slit and gratings. A test light beam passes through a turret of the bandpass filters. The test light beam can be precisely measured band by band. The spectrometer can also quickly and accurately measure a plurality of test light sources having similar spectral characteristics by using the stray light correction factor.