The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 2011
Filed:
Apr. 28, 2009
Keith J. Breinlinger, San Ramon, CA (US);
Benjamin N. Eldridge, Danville, CA (US);
Eric D. Hobbs, Livermore, CA (US);
Douglas S. Ondricek, Dallas, TX (US);
Keith J. Breinlinger, San Ramon, CA (US);
Benjamin N. Eldridge, Danville, CA (US);
Eric D. Hobbs, Livermore, CA (US);
Douglas S. Ondricek, Dallas, TX (US);
FormFactor, Inc., Livermore, CA (US);
Abstract
Embodiments of methods and apparatus for aligning a probe card assembly in a test system are provided herein. In some embodiments, an apparatus for testing devices may include a probe card assembly having a plurality of probes, each probe having a tip for contacting a device to be tested, and having an identified set of one or more features that are preselected in accordance with selected criteria for aligning the probe card assembly within a prober after installation therein. In some embodiments, the identity of the identified set of one or more features may be communicated to the prober to facilitate a global alignment of the probe card assembly that minimizes an aggregate misalignment of all of the tips in the probe card assembly.