The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 2011
Filed:
Jun. 14, 2007
August Jon Hidalgo, San Francisco, CA (US);
Bryan David Miller, Cupertino, CA (US);
Gregor T. Overney, San Jose, CA (US);
August Jon Hidalgo, San Francisco, CA (US);
Bryan David Miller, Cupertino, CA (US);
Gregor T. Overney, San Jose, CA (US);
Agilent Technologies, Inc., Santa Clara, CA (US);
Abstract
A method and apparatus for performing time of flight mass spectrometry wherein the number of sums of transients taken for generating a given spectra is determined as a function of a characteristic of the incoming data for that spectrum. For instance, the number of transient measurements taken for a given spectrum output can be determined as a function of the abundance of ions in the sample or the abundance of ions corresponding to a base peak or another selected peak. In yet another embodiment, the collection of transients is terminated when a threshold signal to noise ratio is attained.