The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 12, 2011

Filed:

Mar. 02, 2009
Applicants:

Jahangir S. Rastegar, Stony Brook, NY (US);

Carlos M. Pereira, Tannersville, PA (US);

Inventors:

Jahangir S. Rastegar, Stony Brook, NY (US);

Carlos M. Pereira, Tannersville, PA (US);

Assignee:

Omnitek Partners LLC, Ronkonkoma, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
F41G 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for onboard measurement of a deviation in orientation of an object from a desired orientation of the object. The method including: transmitting a polarized RF signal from a reference source, with a predetermined polarization plane: receiving the signal at a pair of polarized RF sensor cavities positioned symmetrical on the object with respect to the predetermined polarization plane: analyzing an output of the pair of polarized RF sensor cavities resulting from the received signal: and determining the deviation in orientation of the object relative to the predetermined plane based on the analysis. The method can further include controlling the object based on the determined deviation in orientation.


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