The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 2011
Filed:
Mar. 12, 2007
Shintaro Kasai, Tokyo, JP;
Toshihiko Ouchi, Sagamihara, JP;
Haruko Yoneyama, Saitama, JP;
Masatsugu Yamashita, Wako, JP;
Shintaro Kasai, Tokyo, JP;
Toshihiko Ouchi, Sagamihara, JP;
Haruko Yoneyama, Saitama, JP;
Masatsugu Yamashita, Wako, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
Provided are an analysis method and an analysis apparatus that can perform analysis of a substance and information obtainment with relatively high accuracy and reproducibility without previously allowing a carrier to carry a reagent for a color reaction. In the analysis method and the analysis apparatus, the information on an analyte is obtained by using an electromagnetic wave of a frequency including a frequency band which is at least a part of a frequency range of 30 GHz or more and 30 THz or less. A non-fibrous, isotropic porous material is allowed to hold the analyte, the analyte held by the porous material is irradiated with the electromagnetic wave, a change in the propagation state of the electromagnetic wave due to transmission through or reflection by the porous material is detected and information on the analyte is obtained based on the result of the detection.