The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 12, 2011

Filed:

Aug. 17, 2007
Applicants:

Mark M. Gipp, Racine, WI (US);

Timothy J. Padden, Racine, WI (US);

Robert E. Rogers, Cochrane, CA;

Chwen-jyh Jeng, Edmonton, CA;

Inventors:

Mark M. Gipp, Racine, WI (US);

Timothy J. Padden, Racine, WI (US);

Robert E. Rogers, Cochrane, CA;

Chwen-Jyh Jeng, Edmonton, CA;

Assignee:

S.C. Johnson & Son, Inc., Racine, WI (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B08B 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A test method is disclosed that can be used to test cleaning products. The test method includes applying a known amount of test material to a surface, cleaning the surface and calculating the amount of allergens picked-up from the surface. The calculated amount of allergens picked-up is then corrected for several measurable variables to provide a more accurate determination of the percentage of allergens picked up with the cleaning product.


Find Patent Forward Citations

Quick Actions:

Gipp, Mark. (2011). Method for determining the percentage of allergens picked up from a surface (U.S. Patent No. 7976639). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7976639

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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