The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 2011
Filed:
Jan. 19, 2007
Hiroshi Hohjo, Nagoya, JP;
Hajime Ikuno, Seto, JP;
Hiroshi Hohjo, Nagoya, JP;
Hajime Ikuno, Seto, JP;
Kabushiki Kaisha Toyota Chuo Kenkyusho, Aichi-Gun, JP;
Abstract
A multiple testing system has plural testing units which are disposed independently, and a single information processing device. The testing unit has a frame, a loading mechanism supported at the frame and applying a desired load quantity on a test body, and a detector detecting a load quantity applied on the test body. By multitasking control and with respect to the testing units, the information processing device carries out: feedback control processing for, on the basis of a detected load quantity, controlling the loading mechanism such that the detected load quantity becomes a predetermined target value; control processing at an abnormal situation when at least one of an abnormality of the test body, an abnormality of the testing unit, or an abnormality of a power source of the loading mechanism, is detected; and interface processing with an operator.