The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 05, 2011
Filed:
May. 04, 2006
Manfred Ullrich, Denzlingen, DE;
Martin Bayer, Vörstetten, DE;
Hans-jörg Fink, Freiburg, DE;
Reiner Bidenbach, Vörstetten, DE;
Thilo Rubehn, Grundelfingen, DE;
Manfred Ullrich, Denzlingen, DE;
Martin Bayer, Vörstetten, DE;
Hans-Jörg Fink, Freiburg, DE;
Reiner Bidenbach, Vörstetten, DE;
Thilo Rubehn, Grundelfingen, DE;
Micronas GmbH, Freiburg, DE;
Abstract
A method and circuitry for checking the programming (P) and deletion (L) operations of memory cells () in a nonvolatile memory device (). Parallel to the programming (P) or deletion (L) operations of the actual memory cells () the respective programming or deletion process is carried out on at least one similar checking cell (), with the programming (P) or deletion (L) operations being less favorable by a defined extent than the programming (P) or deletion (L) operations of the actual memory cells (). From the content of the checking cell () an evaluation device () determines whether the programming (P) or deletion (L) operation was successful or not, and a corresponding output signal (ak) indicative thereof is produced.