The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 05, 2011

Filed:

Nov. 09, 2007
Applicants:

Nobuyuki Ohba, Sendai, JP;

Yoshitami Sakaguchi, Hadano, JP;

Kohji Takano, Tokyo, JP;

Inventors:

Nobuyuki Ohba, Sendai, JP;

Yoshitami Sakaguchi, Hadano, JP;

Kohji Takano, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2006.01); G06F 17/40 (2006.01);
U.S. Cl.
CPC ...
Abstract

A detecting apparatus detects the degree of correlation between first events and second events repeatedly occurring in an observed apparatus includes an acquiring unit that acquires second event count values each indicating the number of second events occurring during each first period between each first event and the first event next thereto. A measuring unit measures an observed number of each second event count value derived from the number of times the second event count value is observed. A calculating unit calculates the degree of correlation between the first events and the second events based on the observed number of each second event count value.


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