The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 05, 2011

Filed:

Jun. 27, 2003
Applicant:

Yong Zhou, Waukesha, WI (US);

Inventor:

Yong Zhou, Waukesha, WI (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/055 (2006.01); G01V 3/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention provides a system and method of reducing image intensity variations during imaging acquisitions that utilize large encoding gradient pulses that are played out immediately before a center of k-space is sampled. The present invention includes an acquisition and sampling that implements a predetermined delay in sampling prior to sampling the center of k-space. The delay in sampling the center of k-space following sampling of a peripheral region of k-space maintains the steady state of the MR signal and reduces the image intensity variation caused by eddy current and gradient hysteresis. As such, the intensity variations throughout k-space may be reduced substantially and brought closer to the intrinsic noise level of the data acquisition.


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