The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 05, 2011
Filed:
Feb. 22, 2005
Takayuki Souta, Tokyo, JP;
Katsuo Aizawa, Tokyo, JP;
Atsushi Nakamura, Tokyo, JP;
Satoshi Kageyama, Tokyo, JP;
Shinya Ohtsubo, Tokyo, JP;
Fumihiko Ichikawa, Yotsukaido, JP;
Takayuki Souta, Tokyo, JP;
Katsuo Aizawa, Tokyo, JP;
Atsushi Nakamura, Tokyo, JP;
Satoshi Kageyama, Tokyo, JP;
Shinya Ohtsubo, Tokyo, JP;
Fumihiko Ichikawa, Yotsukaido, JP;
Waseda University, Tokyo, JP;
Abstract
A method of processing skin surface observation measuring data which is able to address various sicknesses and reduce an error in sickness detection, and a measuring apparatus requiring no filter. The measuring apparatus an irradiator applying a white light to a biological surface as a sample, a detector detecting the spectra of the white light reflected off a plurality of positions on the biological surface, a plotter plotting the absorbances of the above spectra to a light spectrum multi-dimensional space, an analyzer subjecting data in the spectrum multi-dimension space obtained from the plurality of positions to multivariate analysis to determine the eigenvectors of at least first, second and third principal components, and a display projecting data at respective positions in respective eigenvector directions to display their magnitudes on a two-dimension display screen on a gray scale or in colors corresponding to the magnitudes; and a measuring method by the apparatus.