The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 05, 2011

Filed:

Mar. 31, 2005
Applicants:

Peter Healey, Ipswich, GB;

Edmund S R Sikora, Ipswich, GB;

Inventors:

Peter Healey, Ipswich, GB;

Edmund S R Sikora, Ipswich, GB;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 5/12 (2006.01);
U.S. Cl.
CPC ...
Abstract

The position of a disturbance on an optical link is evaluated, in particular where the disturbance is a time-varying disturbance. An optical time domain reflectometry technique is used in which a series of low coherence test pulses is launched by means of an optical pulse source into an the optical link, and the backscattered return signal is monitored. The test pulses pass through an unbalanced Mach Zhender interferometer with the result that for each test pulse, a pair of time-displaced pulse copies is launched onto the link. The backscattered return signal is passed through the same interferometer, which causes the pulse copies of each pair to become realigned and to interfere with one another. A time-varying disturbance is likely to affect each pulse copy of a pair differently. As a result, an abnormality such as a step is likely to occur in the backscattered signal. From the time position of an abnormality, the distance of the disturbance responsible is evaluated.


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