The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 05, 2011

Filed:

Sep. 06, 2006
Applicants:

Jennifer Quirin Trelewicz, Superior, CO (US);

Joan Laverne Michell, Longmont, CO (US);

Ravishankar Rao, Elmsford, NY (US);

John B. Condon, Berthoud, CO (US);

David Joseph Shields, Tucson, AZ (US);

Inventors:

Jennifer Quirin Trelewicz, Superior, CO (US);

Joan LaVerne Michell, Longmont, CO (US);

Ravishankar Rao, Elmsford, NY (US);

John B. Condon, Berthoud, CO (US);

David Joseph Shields, Tucson, AZ (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/405 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method, apparatus and article of manufacture for modifying printing based upon direct on-the-fly media characteristic parameters is disclosed. The present invention on-the-fly directly measures a media characteristic parameter and performs real-time print modification in response thereto. The measured characteristic parameters include paper texture and composition, as well as adhesion and penetration of print. The modification of print in response to these measured parameters may allow a customer to maintain observed print quality with lower-cost materials. Adjustments may include the addition of coating, hot rolling, or adjustment of toner concentration. Measured parameters may include mottle, paper texture, and bleed through.


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