The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 05, 2011
Filed:
Dec. 11, 2008
Koji Kobayashi, Chofu, JP;
Naoki Kobayashi, Chofu, JP;
Koji Kobayashi, Chofu, JP;
Naoki Kobayashi, Chofu, JP;
Kowa Company Ltd., , JP;
Abstract
An optical object measurement apparatus includes a light source for generating a low-coherent light beam, which is swept via an array of pinholes on a Nipkow disk that rotates about an axis. A beam splitter splits the swept light beam into a probe light beam toward an object to be measured and a reference light beam toward a reference optical path. The probe light beam from the object and the reference light that has traveled along the reference optical path are combined in the beam splitter to produce interference light. A two-dimensional image-capturing device detects the interference light and produces a video signal to provide reflection intensity information of the interior of the object. This allows an interference optical system to be readily realized and tomographic images of an object to be observed at high levels of resolution and contrast.