The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 05, 2011
Filed:
Aug. 18, 2006
Richard L. Kendrick, San Mateo, CA (US);
Eric H. Smith, San Jose, CA (US);
Richard L. Kendrick, San Mateo, CA (US);
Eric H. Smith, San Jose, CA (US);
Lockheed Martin Corporation, Bethesda, MD (US);
Abstract
A method for reducing noise in a multi-aperture imaging system is provided. Each sub-collector of the system, at least one of which has an adjustable optical path length, collects a portion of a wavefront. The adjustable optical path length is varied to each of a set of predetermined lengths to generate interference patterns. Each interference pattern is recorded at an image plane of the system to generate a recorded interference pattern made up of pixels. Pixel intensity data sets are generated, each of which includes a pixel intensity level from a corresponding one of the pixels from each recorded interference pattern. Each pixel intensity data set is Fourier transformed, and in each Fourier transformed data set, spatial frequencies having power values above a predetermined level are identified. The power levels exceeding the threshold are measured and a resultant image is constructed, where each image pixel thereof corresponds to one pixel intensity data set and has one or more intensity values corresponding to the measured power values for that corresponding pixel intensity data set.