The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 05, 2011

Filed:

Apr. 25, 2007
Applicants:

John J. Reilly, Waltham, MA (US);

Thomas E. Breen, Winchester, MA (US);

Paul J. Hurd, Norfolk, MA (US);

Michael J. Lanzaro, North Reading, MA (US);

Maya M. Radzinski, Palo Alto, CA (US);

Thomas W. Grudkowski, Pleasanton, CA (US);

Edward E. Bromberg, Orlando, FL (US);

Joseph Carter, Los Gatos, CA (US);

Inventors:

John J. Reilly, Waltham, MA (US);

Thomas E. Breen, Winchester, MA (US);

Paul J. Hurd, Norfolk, MA (US);

Michael J. Lanzaro, North Reading, MA (US);

Maya M. Radzinski, Palo Alto, CA (US);

Thomas W. Grudkowski, Pleasanton, CA (US);

Edward E. Bromberg, Orlando, FL (US);

Joseph Carter, Los Gatos, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 13/89 (2006.01);
U.S. Cl.
CPC ...
Abstract

A surveillance system is disclosed. In some embodiments, the surveillance system may include at least one controller configured to receive information data from at least one upstream information source and to control operation of at least one controllable downstream information source based, at least in part, on the information data. A surveillance method also is disclosed. In some embodiments, the method may include analyzing screening data, obtaining information data, and reanalyzing the screening data based, at least in part, on the obtained information data.


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