The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 05, 2011
Filed:
Nov. 23, 2007
Hui-ta Chen, Taichung, TW;
Guo-shing Huang, Tainan, TW;
Ching-chih Lin, Kaohsiung, TW;
Chun-hao Chang, Kaohsiung County, TW;
Chuan-sheng Zhuang, Taichung County, TW;
Ming-hsien Ko, Chiayi County, TW;
Chih-hung Kao, Changhua County, TW;
Hui-Ta Chen, Taichung, TW;
Guo-Shing Huang, Tainan, TW;
Ching-Chih Lin, Kaohsiung, TW;
Chun-Hao Chang, Kaohsiung County, TW;
Chuan-Sheng Zhuang, Taichung County, TW;
Ming-Hsien Ko, Chiayi County, TW;
Chih-Hung Kao, Changhua County, TW;
Industrial Technology Research Institute, Hsin-Chu, TW;
Abstract
A method and an apparatus for inspecting radio frequency identification (RFID) tags which utilize a way of shielding for inspecting whether RFID tags function properly or not. The method of the present invention comprises steps of: reading a plurality of RFID tags in a readable zone; and determining whether there is any malfunctional RFID tag in the plurality of RFID tags. If all the plurality of RFID tags function properly, the method will check a next plurality of RFID tags. If there is at least one unreadable RFID tag, the at least one malfunctional RFID tag will be found by shielding one or the plurality of RFID tags. By means of the disclosure in the present invention, the present method and apparatus are capable of improving the efficiency during inspection and simplifying the design of a readable zone.