The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 05, 2011

Filed:

Aug. 20, 2008
Applicants:

Vance D. Archer, Iii, Greensboro, NC (US);

Daniel P. Chesire, Winter Garden, FL (US);

Warren K. Gladden, Macungie, PA (US);

Seung H. Kang, San Diego, CA (US);

Taeho Kook, Orlando, FL (US);

Sailesh M. Merchant, Macungie, PA (US);

Vivian Ryan, Hampton, NJ (US);

Inventors:

Vance D. Archer, III, Greensboro, NC (US);

Daniel P. Chesire, Winter Garden, FL (US);

Warren K. Gladden, Macungie, PA (US);

Seung H. Kang, San Diego, CA (US);

Taeho Kook, Orlando, FL (US);

Sailesh M. Merchant, Macungie, PA (US);

Vivian Ryan, Hampton, NJ (US);

Assignee:

Agere Systems Inc., Allentown, PA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention, in one aspect, provides a semiconductor device (), including transistors (), dielectric layers () located over the transistors (), interconnects () formed within the dielectric layers (), and a test structure () located adjacent a hot-spot () of the semiconductor device () and configured to monitor a real-time operational parameter of at least one of the transistors () or interconnects ().


Find Patent Forward Citations

Loading…