The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 05, 2011
Filed:
Nov. 14, 2007
Applicants:
Mark Lesk, Montreal, CA;
Marcelo Wajszilber, Côte Saint-Luc, CA;
Tsuneyuki Ozaki, Brossard, CA;
Inventors:
Assignee:
RSEM, Limited Partnership, Montreal, Quebec, unknown;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/10 (2006.01);
U.S. Cl.
CPC ...
Abstract
The present invention relates to an apparatus and a method for measuring a displacement in vivo in situ of an eye, along with a method of assessing of an eye condition. More particularly, the apparatus and method of the present invention permits measurements of a displacement of at least two points in proximity of an optic disc, in the eye of a patient. For doing so, the apparatus uses a probing unit, an analog/digital converter and an analyzer. The displacement measured may include a pulsatile displacement of the lamina cribrosa, so as to perform early assessment of an eye condition.