The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 05, 2011
Filed:
Jul. 31, 2008
Hiroyuki Hiramatsu, Toyokawa, JP;
Yukinobu Ban, Nishio, JP;
Hiroyuki Hiramatsu, Toyokawa, JP;
Yukinobu Ban, Nishio, JP;
Nidek Co., Ltd., Gamagori-shi, JP;
Abstract
An intraocular lens selection apparatus and an intraocular lens selection method for selecting an intraocular lens to be implanted into an examinee's eye. The apparatus has an input unit which inputs corneal wavefront aberration of the eye, a memory which stores wavefront aberrations of a plurality of intraocular lens models, an unit which sets, as a target value, desired post-operative residual wavefront aberration of the eye after the lens is implanted, an unit which calculates, as an estimated value, post-operative residual wavefront aberration of the eye to be obtained when each lens model is implanted, based on the inputted corneal wavefront aberration and the stored wavefront aberration of each lens model, and specifies one of the lens models which renders the estimated value close to the set target value, a monitor, and a display control unit which controls the monitor to display information of the specified lens model.