The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 05, 2011
Filed:
May. 23, 2008
Bor-jiunn Wen, Hsinchu, TW;
Cheng-hsien Chen, Chiayi, TW;
Zong-ying Chung, Kaohsiung, TW;
Hsin-yi Ko, Taipei, TW;
Ming-chieh Huang, Taipei County, TW;
Bor-Jiunn Wen, Hsinchu, TW;
Cheng-Hsien Chen, Chiayi, TW;
Zong-Ying Chung, Kaohsiung, TW;
Hsin-Yi Ko, Taipei, TW;
Ming-Chieh Huang, Taipei County, TW;
Industrial Technology Research Institute, Hsinchu, TW;
Abstract
A method for inspecting characteristics of bended flexible unit is disclosed, which comprises steps of: (a) providing a clip unit, an observing unit, a characteristic-inspecting unit and a controlling unit; said clip unit, observing unit, and characteristic-inspecting unit are electrically connected to said controlling unit which stored a predetermined radius; (b) the clip unit clips a flexible unit and bends the same; (c) the observing unit gets the lateral profile of the flexible unit and sends it to the controlling unit which calculates the bending radius thereof accordingly; and (d) the controlling unit determines if the bending radius is the same to the predetermined one; if positive, the clip unit stops and the characteristic-inspecting unit inspects the characteristic of said flexible unit; if negative, the procedure returns to step (b).