The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 28, 2011
Filed:
Mar. 18, 2008
Rao H. Desineni, Poughkeepsie, NY (US);
Maroun Kassab, St.-Eustache, CA;
Franco Motika, Hopewell Junction, NY (US);
Leah Marie Pfeifer Pastel, Essex, VT (US);
Rao H. Desineni, Poughkeepsie, NY (US);
Maroun Kassab, St.-Eustache, CA;
Franco Motika, Hopewell Junction, NY (US);
Leah Marie Pfeifer Pastel, Essex, VT (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method of testing an integrated circuit. The method includes selecting a set of physical features of nets and devices of the integrated circuit, the integrated circuit having pattern input points and pattern observation points connected by the nets, each of the nets defined by an input point and all fan out paths to (i) input points of other nets of the nets or (ii) to the pattern observation points; selecting a measurement unit for each feature of the set of features; assigning a weight to each segment of each fan out path based on a number of the measurement units of the feature in each segment of each fan out path of each of the nets; and generating a set of test patterns optimized for test-coverage and cost based on the weights assigned to each segment of each of the nets of the integrated circuit.