The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 28, 2011

Filed:

Apr. 09, 2008
Applicants:

Bruce Eliot Duewer, Austin, TX (US);

Richard Dean Putman, Austin, TX (US);

Inventors:

Bruce Eliot Duewer, Austin, TX (US);

Richard Dean Putman, Austin, TX (US);

Assignee:

Cirrus Logic, Inc., Austin, TX (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of forming a scan chain for testing an integrated circuit includes examining an interconnection of register elements in an integrated circuit design. A register element segment is identified which includes a source register element having an output and a destination register element having an input directly coupled to the output of the source register element. The segment is selectively coupled to another scan register element to form a portion of scan chain.


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