System and method for defect-based scan analysis

Abstract

A method for defect-based scan analysis comprises, determining a neighborhood net for a circuit node, injecting defects into the neighborhood net, modeling the defects with stuck-at-0 and stuck-at-1 fault models, generating and applying test patterns to the neighborhood net, determining whether the injected defects are observable as faults, adding the test patterns to a set of effective test patterns if the defects are observable, mapping the test patterns to possible stuck-at-0 faults or stuck-at-1 faults, collecting stuck-at-0 and stuck-at-1 fault test patterns, performing stuck-at-0 and stuck-at-1 fault simulations using the stuck-at-0 and stuck-at-1 fault test patterns, respectively, generating first and second fault lists, combining first and second fault lists into combined fault lists, deriving a description of the combined fault lists using a complete set of fault models, filtering the combined fault lists to yield a collection of effective faults, and determining a defect for each of the effective faults.