The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 28, 2011
Filed:
Jan. 22, 2008
Rafael Goodman Dowling, Kirkland, WA (US);
Ryan Randal Elliott, Bothell, WA (US);
Israel Hilerio, Kendall, WA (US);
Rafael Goodman Dowling, Kirkland, WA (US);
Ryan Randal Elliott, Bothell, WA (US);
Israel Hilerio, Kendall, WA (US);
Microsoft Corporation, Redmond, WA (US);
Abstract
A failure identification routine uses a two pass stack trace analysis in conjunction with a list of called types. As each method is called, a call list is generated with the called type, method, and various metadata. During the first pass stack trace analysis, each stack frame is analyzed to determine if the failed type is included in the stack frame. If so, the method associated with the frame is flagged as suspect. If the failed type is not found in the first stack trace, a second pass stack trace analysis is performed and an assembly associated with the method associated with the stack frame is analyzed to determine a set of types. The set of types are analyzed to find at least one match with the called types. If a match exists, the methods associated with the matched types are flagged as suspect.