The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 28, 2011
Filed:
Mar. 05, 2008
Yury Prilutsky, San Mateo, CA (US);
Eran Steinberg, San Francisco, CA (US);
Peter Corcoran, Claregalway, IE;
Alexei Pososin, Galway, IE;
Petronel Bigioi, Galway, IE;
Mihai Ciuc, Bucharest, RO;
Yury Prilutsky, San Mateo, CA (US);
Eran Steinberg, San Francisco, CA (US);
Peter Corcoran, Claregalway, IE;
Alexei Pososin, Galway, IE;
Petronel Bigioi, Galway, IE;
Mihai Ciuc, Bucharest, RO;
Tessera Technologies Ireland Limited, Galway, IE;
Abstract
The detection of red-eye defects is enhanced in digital images for embedded image acquisition and processing systems. A two-stage redeye filtering system includes a speed optimized filter that performs initial segmentation of candidate redeye regions and optionally applies a speed-optimized set of falsing/verification filters to determine a first set of confirmed redeye regions for correction. Some of the candidate regions which are rejected during the first stage are recorded and re-analyzed during a second stage by an alternative set of analysis-optimized filters to determine a second set of confirmed redeye regions.