The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 28, 2011
Filed:
Jul. 24, 2008
Alexander I. Gilevich, Sunnyvale, CA (US);
Francis Allan Anderson, San Fransisco, CA (US);
Alexander I. Gilevich, Sunnyvale, CA (US);
Francis Allan Anderson, San Fransisco, CA (US);
InspX LLC, Fremont, CA (US);
Abstract
The present invention is an apparatus and method for detecting foreign material in containers in a product stream. Two X-ray emitters and two sensor arrays are positioned in a constellation to improve the detection of foreign material. A first x-ray emitter is positioned so that it projects an x-ray beam in a downward manner through the product stream. A second x-ray emitter is positioned so that it projects an x-ray beam in an upward manner through the product stream. Two sensor arrays are each positioned in receiving relation to each of the x-ray beams to receive and provide signals from each of the beams after they have interacted with the product stream. Signals from each of the two sensor arrays are processed and compared with user defined thresholds to detect and indicate the presence of foreign material in containers.